Categories: StatisticsElectrical Engineering

Measuring a Small Number of Samples, and the 3v Fallacy: Shedding Light on Confidence and Error Intervals

Hanspeter Schmid, Alex Huber

DOI: 10.1109/mssc.2014.2313714

Journal-article 2014 in IEEE Solid-State Circuits Magazine volume 6 issue 2 on page 52-58
© Institute of Electrical and Electronics Engineers (IEEE)

Keywords: #ic  #ic-design  #integrated circuit  #statistics  Edit keywords

1 0 5.0 Posted: 11.Apr.2018

A very general approach to statistically handling small sample numbers with unknown distribution. This is especially a wide-known issue with multi project wafers in the academic world of IC-design. The authors present a simple way of dealing with an unknown distribution, making it possible to investigate the approximate median and specific percentiles with a given level of confidence.

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